Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction
Descripción
Statistical analysis and yield estimation of high-frequency electronic circuits are critical steps for manufacturability-driven design. Accurate yield prediction typically requires massive amounts of computationally intensive high-fidelity simulations, such as full-wave electromagnetic (EM) simulations, to cover the entire statistic of possible outcomes of a given manufacturing process.ITESO, A.C.
Consejo Nacional de Ciencia y Tecnología