| dc.contributor.author | Rayas-Sánchez, José E. | |
| dc.date.accessioned | 2013-05-21T17:03:36Z | |
| dc.date.accessioned | 2023-03-21T21:08:47Z | |
| dc.date.available | 2013-05-21T17:03:36Z | |
| dc.date.available | 2023-03-21T21:08:47Z | |
| dc.date.issued | 2006-11 | |
| dc.identifier.citation | J. E. Rayas-Sánchez, “Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction,” in Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization (SMSMEO-06), Lyngby, Denmark, Nov. 2006. | es |
| dc.identifier.uri | https://hdl.handle.net/20.500.12032/75694 | |
| dc.description | Statistical analysis and yield estimation of high-frequency electronic circuits are critical steps for manufacturability-driven design. Accurate yield prediction typically requires massive amounts of computationally intensive high-fidelity simulations, such as full-wave electromagnetic (EM) simulations, to cover the entire statistic of possible outcomes of a given manufacturing process. | es |
| dc.description.sponsorship | ITESO, A.C. | es |
| dc.description.sponsorship | Consejo Nacional de Ciencia y Tecnología | es |
| dc.language.iso | eng | es |
| dc.publisher | International Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization | es |
| dc.relation.ispartofseries | Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization;2006 | |
| dc.rights.uri | http://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf | es |
| dc.subject | Yield Estimation | es |
| dc.subject | High-frequency Electronic Circuits | es |
| dc.subject | Electromagnetic Based Design | es |
| dc.title | Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction | es |
| dc.type | info:eu-repo/semantics/conferencePaper | es |
