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Influence of minor Zn addition on the microstructural stability of Sn-0.7 wt% Cu solder after aging and electromigration
dc.contributor.advisor | Rhod, Eduardo Luis | |
dc.contributor.author | Ilha, Bernardo Bortolotto | |
dc.date.accessioned | 2018-10-03T13:26:39Z | |
dc.date.accessioned | 2022-09-22T19:30:23Z | |
dc.date.available | 2018-10-03T13:26:39Z | |
dc.date.available | 2022-09-22T19:30:23Z | |
dc.date.issued | 2018-01-16 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12032/61674 | |
dc.description.sponsorship | UNISINOS - Universidade do Vale do Rio dos Sinos | pt_BR |
dc.language | pt_BR | pt_BR |
dc.publisher | Universidade do Vale do Rio dos Sinos | pt_BR |
dc.rights | openAccess | pt_BR |
dc.subject | Sn solder | en |
dc.title | Influence of minor Zn addition on the microstructural stability of Sn-0.7 wt% Cu solder after aging and electromigration | pt_BR |
dc.type | Dissertação | pt_BR |
Ficheros en el ítem
Ficheros | Tamaño | Formato | Ver |
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Bernardo Bortolotto Ilha_.pdf | 35.18Mb | application/pdf | Ver/ |