SOI Stacked Transistors Tolerance to Single-Event Effects
| dc.contributor.author | PERIN, ANDRE L. | |
| dc.contributor.author | PEREIRA, ARIANNE S. N. | |
| dc.contributor.author | BUHLER, RUDOLF T. | |
| dc.contributor.author | DA SILVEIRA, MARCILEI A. G. | |
| dc.contributor.author | GIACOMINI, RENATO C. | |
| dc.date.accessioned | 2019-08-19T23:47:20Z | |
| dc.date.available | 2019-08-19T23:47:20Z | |
| dc.date.issued | 2019 | |
| dc.identifier.citation | PERIN, ANDRE L.; PEREIRA, ARIANNE S. N.; BUHLER, RUDOLF T.; DA SILVEIRA, MARCILEI A. G.; GIACOMINI, RENATO C.. SOI Stacked Transistors Tolerance to Single-Event Effects. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v. 1, p. 1-1, 2019. | |
| dc.identifier.issn | 1530-4388 | |
| dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/1480 | |
| dc.relation.ispartof | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
| dc.rights | Acesso Restrito | |
| dc.title | SOI Stacked Transistors Tolerance to Single-Event Effects | pt_BR |
| dc.type | Artigo | pt_BR |
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