SOI Stacked Transistors Tolerance to Single-Event Effects

dc.contributor.author	PERIN, ANDRE L.
dc.contributor.author	PEREIRA, ARIANNE S. N.
dc.contributor.author	BUHLER, RUDOLF T.
dc.contributor.author	DA SILVEIRA, MARCILEI A. G.
dc.contributor.author	GIACOMINI, RENATO C.
dc.date.accessioned	2019-08-19T23:47:20Z
dc.date.available	2019-08-19T23:47:20Z
dc.date.issued	2019
dc.identifier.citation	PERIN, ANDRE L.; PEREIRA, ARIANNE S. N.; BUHLER, RUDOLF T.; DA SILVEIRA, MARCILEI A. G.; GIACOMINI, RENATO C.. SOI Stacked Transistors Tolerance to Single-Event Effects. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v. 1, p. 1-1, 2019.
dc.identifier.issn	1530-4388
dc.identifier.uri	https://repositorio.fei.edu.br/handle/FEI/1480
dc.relation.ispartof	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
dc.rights	Acesso Restrito
dc.title	SOI Stacked Transistors Tolerance to Single-Event Effects	pt_BR
dc.type	Artigo	pt_BR

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