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Neutron radiation effects on an electronic system on module

LO PRESTI, D.; MEDINA, N. H.; MORALLES, M. M.; AGUIAR, V. AP; OLIVEIRA, J. R. B.; ADDED, N.; MACCHIONE, E. L. A.; SIQUEIRA, P. DE T. D.; ZAHN, G. Z.; GENEZINI, F.; BONANNO, D.; GALLO, G.; RUSSO, S.; SGOUROS, O.; MUOIO, A.; PANDOLA, L.; CAPPUZZELLO, F. (2020-08-13)

The NUMEN (NUclear Matrix Elements for Neutrinoless double beta decay) project was recently proposed with the aim to investigate the nuclear response to Double Charge Exchange reactions for all the isotopes explored by ...
Single-event effects: experimental setup for power MOSFETs and diffusion model for cross section calculations in low-voltage MOSFETs

ALBERTON, S G; MEDINA, N H; ADDED, N; AGUIAR, V A P; MENEGASSO, R; MACCHIONE, E L A; GUAZZELLI, Marcilei Aparecida (2019-01-05)

MOSFETs are subject to di erent types of Single-Event E ects (SEEs) induced by heavy ions, with low-voltage MOSFETs being more susceptible to non-destructive e ects, such as Single-Event Transients, than high-voltage MOSFETs ...

Centro Universitario FEI: Recent submissions