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A physically-based threshold voltage definition, extraction and analytical model for junctionless nanowire transistors

Trevisoli R.D.; Doria R.T.; De Souza M.; Pavanello M.A. (2013)

This work proposes a physically-based definition for the threshold voltage, VTH, of junctionless nanowire transistors and a methodology to extract it. The VTH is defined as the point of equal magnitude for the drift and ...

Improved operation of graded-channel SOI nMOSFETs down to liquid helium temperature

Pavanello M.A.; De Souza M.; Ribeiro T.A.; Martino J.A.; Flandre D. (2016)

© 2016 IOP Publishing Ltd.This paper presents the operation of Graded-Channel (GC) Silicon-On-Insulator (SOI) nMOSFETs at low temperatures down to liquid helium temperature in comparison to standard uniformly doped ...

Low-frequency noise and effective trap density of short channel p- and n-types junctionless nanowire transistors

Doria R.T.; Trevisoli R.; De Souza M.; Pavanello M.A. (2014)

This work presents an evaluation of the Low-Frequency Noise (LFN) exhibited by short-channel Junctionless Nanowire Transistors (JNTs). Unlike in previous works in which only the noise of n-type transistors was evaluated, ...

Analysis of the leakage current in junctionless nanowire transistors

Trevisoli R.; Trevisoli Doria R.; De Souza M.; Antonio Pavanello M. (2013)

This letter presents an analysis of the leakage current in Junctionless Nanowire Transistors. The analysis is performed using experimental data together with three-dimensional numerical simulations. The influences of the ...

Analytical model for the dynamic behavior of triple-gate junctionless nanowire transistors

Trevisoli R.; Doria R.T.; De Souza M.; Barraud S.; Vinet M.; Pavanello M.A. (2016)

© 2015 IEEE.This paper presents an analytical model for the intrinsic capacitances and transconductances of triple-gate junctionless nanowire transistors. The model is based on a surface-potential drain current model, which ...

The zero temperature coefficient in junctionless nanowire transistors

Trevisoli R.D.; Trevisoli Doria R.; De Souza M.; Das S.; Ferain I.; Antonio Pavanello M. (2012)

This Letter presents an analysis of the zero temperature coefficient (ZTC) bias in junctionless nanowire transistors (JNTs). Unlike in previous works, which had shown that JNT did not present a ZTC point, this work shows ...

Trap density characterization through low-frequency noise in junctionless transistors

Doria R.T.; Trevisoli R.D.; De Souza M.; Pavanello M.A. (2013)

This work evaluates, for the first time, the trap density of Junctionless Nanowire Transistors (JNTs) of two technologies produced with different gate dielectrics through the low-frequency noise (LFN) characterization. ...

Threshold voltage in junctionless nanowire transistors

Trevisoli R.D.; Doria R.T.; De Souza M.; Pavanello M.A. (2011)

This work presents a physically based analytical model for the threshold voltage in junctionless nanowire transistors (JNTs). The model is based on the solution of the two-dimensional Poisson equation and includes the ...

Junctionless multiple-gate transistors for analog applications

Doria R.T.; Pavanello M.A.; Trevisoli R.D.; De Souza M.; Lee C.-W.; Ferain I.; Akhavan N.D.; Yan R.; Razavi P.; Yu R.; Kranti A.; Colinge J.-P. (2011)

This paper presents the evaluation of the analog properties of nMOS junctionless (JL) multigate transistors, comparing their performance with those exhibited by inversion-mode (IM) trigate devices of similar dimensions. ...

On the improvement of DC analog characteristics of FD SOI transistors by using asymmetric self-cascode configuration

De Souza M.; Flandre D.; Doria R.T.; Trevisoli R.; Pavanello M.A. (2016)

© 2015 Elsevier Ltd. All rights reserved.This paper demonstrates the improvement of DC analog performance of FD SOI transistors provided by the adoption of asymmetric self-cascode (A-SC) configuration. It consists of two ...