Extraction of Mobility Degradation and Source-and-Drain Resistance in MOSFETs
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Data
2010Autor
MUCI, Juan
LATORRE-REY, A. D.
GARCIA-SANCHEZ, Francisco
LUGO-MUÑOZ, D.
ORTIZ-CONDE, Adelmo
HO, C. S.
LIOU, J. J.
PAVANELLO, Marcelo A.
TREVISOLI, Renan Doria