| dc.contributor.author | Rayas-Sánchez, José E. | |
| dc.contributor.author | Bandler, John W. | |
| dc.contributor.author | Zhang, Qi J. | |
| dc.date.accessioned | 2013-05-20T17:19:18Z | |
| dc.date.accessioned | 2023-03-21T16:41:05Z | |
| dc.date.available | 2013-05-20T17:19:18Z | |
| dc.date.available | 2023-03-21T16:41:05Z | |
| dc.date.issued | 2001 | |
| dc.identifier.citation | J. W. Bandler, J. E. Rayas-Sánchez and Q. J. Zhang, “EM-based statistical analysis and yield optimization using space mapping based neuromodels,” in Micronet Annual Workshop, Ottawa, ON, Apr. 2001, pp. 69-70. | es |
| dc.identifier.uri | https://hdl.handle.net/20.500.12032/73718 | |
| dc.description | Accurate yield optimization and statistical analysis of
microwave components are crucial in manufacturabilitydriven
designs in a time-to-market development
environment. Yield optimization requires intensive
simulations to cover the entire statistic of possible outcomes
of a given manufacturing process. Performing direct yield
optimization using accurate full wave electromagnetic (EM)
simulations does not appear feasible. Here, an efficient
procedure to realize EM-based yield optimization and
statistical analysis of microwave structures using space
mapping-based neuromodels is proposed.
We have mathematically formulated the yield optimization
problem using SM-based neuromodels. A general equation
to express the relationship between the fine and coarse
model sensitivities through a nonlinear, frequency-sensitive
neuromapping has been found.
We illustrate our technique by the yield analysis and
optimization of an HTS filter. Here we assume symmetric
variations in the physical parameters due to tolerances.
Efficient procedures have also been developed for the
asymmetric case. | es |
| dc.description.sponsorship | ITESO, A.C. | es |
| dc.language.iso | eng | es |
| dc.publisher | Micronet Annual Workshop | es |
| dc.relation.ispartofseries | Micronet Annual Workshop;2001 | |
| dc.rights.uri | http://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf | es |
| dc.subject | Microwave Circuits | es |
| dc.subject | Electromagnetic Based Design | es |
| dc.subject | Space Mapping | es |
| dc.subject | Neural Networks | es |
| dc.title | EM-based Statistical Analysis and Yield Optimization using Space Mapping Based Neuromodels | es |
| dc.type | info:eu-repo/semantics/conferencePaper | es |
