EM-based Statistical Analysis and Yield Optimization using Space Mapping Based Neuromodels
View/
Date
2001Author
Rayas-Sánchez, José E.
Bandler, John W.
Zhang, Qi J.
Metadata
Show full item recordDescription
Accurate yield optimization and statistical analysis of microwave components are crucial in manufacturabilitydriven designs in a time-to-market development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full wave electromagnetic (EM) simulations does not appear feasible. Here, an efficient procedure to realize EM-based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. We have mathematically formulated the yield optimization problem using SM-based neuromodels. A general equation to express the relationship between the fine and coarse model sensitivities through a nonlinear, frequency-sensitive neuromapping has been found. We illustrate our technique by the yield analysis and optimization of an HTS filter. Here we assume symmetric variations in the physical parameters due to tolerances. Efficient procedures have also been developed for the asymmetric case.ITESO, A.C.