The Influence of Back Gate Bias on the OCTO SOI MOSFET?s Response to X-ray Radiation

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Date

2015

Author

DE SOUZA FINO, LEONARDO NAVARENHO

Gimenez, S. P.

RENAUX, C.

FLANDRE, DENIS

GUAZZELLI DA SILVEIRA, MARCILEI APARECIDA

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URI

https://hdl.handle.net/20.500.12032/40972

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Documentos - CUFEI