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In-depth low frequency noise evaluation of substrate rotation and strain engineering in N-type triple gate SOI Finfets
(2015)
© 2015 Elsevier B.V. All rights reserved.This work presents an experimental analysis of the low-frequency noise and the effective trap density of conventional, strained, rotated and strained-rotated SOI n-type FinFETs, ...
Extraction of the interface trap density energetic distribution in SOI Junctionless Nanowire Transistors
(2015)
© 2015 Elsevier B.V. All rights reserved.Abstract This work proposes a method for extracting the energetic distribution of the interface trap density at the gate dielectric in Junctionless silicon Nanowire Transistors. The ...