Now showing items 1-5 of 5
Analytical model for the dynamic behavior of triple-gate junctionless nanowire transistors
© 2015 IEEE.This paper presents an analytical model for the intrinsic capacitances and transconductances of triple-gate junctionless nanowire transistors. The model is based on a surface-potential drain current model, which ...
Harmonic distortion analysis of triple gate SOI nanowire MOSFETS down to 100 K
© 2017 Elsevier LtdThe linearity of triple gate nanowire transistors (NWs) implemented on a Silicon-On-Insulator (SOI) substrate is investigated in this work considering temperature (T) influence. The analysis is performed ...
Junctionless nanowire transistors parameters extraction based on drain current measurements
© 2019 Elsevier LtdThe aim of this work is to propose and qualify a systematic method for parameters extraction of Junctionless Nanowire Transistors (JNTs) based on drain current measurements and compact modeling. As ...
Modeling the interface traps-related low frequency noise in triple-gate SOI junctionless nanowire transistors
© 2019 Elsevier B.V.The aim of this work is to propose a semi-analytical model for the low frequency noise caused by interface traps in Triple-Gate Junctionless Nanowire Transistors. The proposed model is based on a drain ...
Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization
© 2017 Elsevier B.V.This work presents, for the first time, an experimental analysis of the low-frequency noise and the effective trap density dependence of junctionless nanowire transistors (JNTs) on the substrate bias. ...