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dc.contributor.authorde Souza M.
dc.contributor.authorFlandre D.
dc.contributor.authorPavanello M.A.
dc.date.accessioned2019-08-19T23:45:09Z
dc.date.available2019-08-19T23:45:09Z
dc.date.issued2009
dc.identifier.citationDE SOUZA, Michelly; FLANDRE, Denis; PAVANELLO, Marcelo A.. Analysis of Source Follower Buffers Implemented with Graded-Channel SOI nMOSFETs Operating at Cryogenic Temperatures. Cryogenics (Guildford), v. 49, n. 11, p. 599-604, 2009.
dc.identifier.issn0011-2275
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1076
dc.description.abstractThis work studies the operation of source-follower buffers implemented with standard and graded-channel (GC) fully depleted (FD) SOI nMOSFETs at low temperatures. The analysis is performed by comparing the voltage gain of buffers implemented with GC and standard SOI nMOS transistors considering devices with the same mask channel length and same effective channel length. It is shown that the use of GC devices allows for achieving improved gain in all inversion levels in a wide range of temperatures. In addition, this improvement increases as temperature is reduced. It is shown that GC transistors can provide virtually constant gain, while for standard devices, the gain departs from the maximum value depending on the temperature and inversion level imposed by the bias current and input voltage. Two-dimensional numerical simulations were performed in order to study the reasons for the enhanced gain of GC MOSFETs at low temperatures. © 2009 Elsevier Ltd. All rights reserved.
dc.relation.ispartofCryogenics
dc.rightsAcesso Restrito
dc.titleAnalysis of source-follower buffers implemented with graded-channel SOI nMOSFETs operating at cryogenic temperatures
dc.typeArtigo


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