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dc.contributor.authorGimenez S.P.
dc.contributor.authorPavanello M.A.
dc.contributor.authorMartino J.A.
dc.contributor.authorFlandre D.
dc.date.accessioned2019-08-19T23:45:08Z
dc.date.accessioned2023-05-03T20:36:23Z
dc.date.available2019-08-19T23:45:08Z
dc.date.available2023-05-03T20:36:23Z
dc.date.issued2006
dc.identifier.citationGIMENEZ, Salvador Pinillos; PAVANELLO, Marcelo A.; MARTINO, João Antonio; FLANDRE, Denis. Gain improvement in operational transconductance amplifiers using Graded-Channel SOI nMOSFETS. Microelectronics Journal, v. 37, n. 1, p. 31-37, 2006.
dc.identifier.issn0026-2692
dc.identifier.urihttps://hdl.handle.net/20.500.12032/89182
dc.description.abstractThis paper studies the performance of operational transconductance amplifiers (OTAs) fabricated with Graded-Channel (GC) SOI nMOSFETs and designed to provide high open-loop voltage gain or high gain-bandwidth characteristics. Different design targets were taken in account such as similar power dissipation, transconductance over drain current ratio and die area. Comparisons with OTAs made with conventional SOI nMOSFETs, are performed showing that the GC OTAs presents larger open-loop voltage gain without degrading the phase margin, unit gain frequency and slew rate simultaneously with a significant required die area reduction depending on LLD/L ratio used. Circuit simulations and experimental results are used to qualify the analysis. © 2005 Elsevier Ltd. All rights reserved.
dc.relation.ispartofMicroelectronics Journal
dc.rightsAcesso Restrito
dc.titleGain improvement in operational transconductance amplifiers using Graded-Channel SOI nMOSFETS
dc.typeArtigo


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