dc.rights.license | Creative Commons "Este é um artigo publicado em acesso aberto sob uma licença Creative Commons (CC BY 3.0). Fonte: https://publishingsupport.iopscience.iop.org/licence-policy-for-articles-published-on-a-gold-open-access-basis/. Acesso em: 22 jun 2021 | |
dc.contributor.author | ZAHN, G S | |
dc.contributor.author | GENEZINI, F A | |
dc.contributor.author | MORALLES, M | |
dc.contributor.author | SIQUEIRA, P T D | |
dc.contributor.author | MEDINA, N H | |
dc.contributor.author | AGUIAR, V A P | |
dc.contributor.author | MACCHIONE, E L A | |
dc.contributor.author | ADDED, N | |
dc.contributor.author | GUAZZELLI, Marcilei Aparecida | |
dc.date.accessioned | 2021-06-22T15:32:57Z | |
dc.date.accessioned | 2023-05-03T20:34:49Z | |
dc.date.available | 2021-06-22T15:32:57Z | |
dc.date.available | 2023-05-03T20:34:49Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | ZAHN, G S; GENEZINI, F A; MORALLES, M; SIQUEIRA, P T D; MEDINA, N H; AGUIAR, V A P; MACCHIONE, E L A; ADDED, N; GUAZZELLI, M. A. Aparecida. A proposal to study long-lived isotopes produced by thermal neutron irradiation of digital devices. JOURNAL OF PHYSICS: CONFERENCE SERIES, v. 1291, p. 012020, 2019. | pt_BR |
dc.identifier.issn | 1742-6588 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12032/88889 | |
dc.description.abstract | In this work, we present a facility to study errors in digital devices exposed to thermal neutrons from a beam hole in the IEA-R1 nuclear reactor, as well as the long-lived isotopes produced in the irradiation of digital electronic devices under a slow neutron field. Preliminary results obtained with the analysis of a 28nm SRAM-based Xilinx Zynq-7000 FPGA are presented. | en |
dc.format.extent | 3 | pt_BR |
dc.language.iso | en | pt_BR |
dc.relation.ispartof | JOURNAL OF PHYSICS. CONFERENCE SERIES (PRINT) | |
dc.rights | Aberto | pt_BR |
dc.title | A proposal to study long-lived isotopes produced by thermal neutron irradiation of digital devices | pt_BR |
dc.type | Artigo | pt_BR |