Back-Biased Undoped Nanowire-Based FETs in Silicon-On-Insulator Substrates with Nanometric Thicknesses
| dc.contributor.author | NEMER, Juliana P. | |
| dc.contributor.author | PUYDINGER, M. | |
| dc.contributor.author | DINIZ, José Alexandre | |
| dc.contributor.author | PAVANELLO, Marcelo A. | |
| dc.date.accessioned | 2019-08-19T23:45:13Z | |
| dc.date.accessioned | 2023-05-03T20:34:39Z | |
| dc.date.available | 2019-08-19T23:45:13Z | |
| dc.date.available | 2023-05-03T20:34:39Z | |
| dc.date.issued | 2018 | |
| dc.identifier.citation | NEMER, Juliana P.; PUYDINGER, M.; DINIZ, José Alexandre; PAVANELLO, Marcelo A.. Back-Biased Undoped Nanowire-Based FETs in Silicon-On-Insulator Substrates with Nanometric Thicknesses. Journal of Nanoelectronics and Optoelectronics, v. 13, p. 178-182, 2018. | |
| dc.identifier.issn | 1555-130X | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12032/88855 | |
| dc.relation.ispartof | Journal of Nanoelectronics and Optoelectronics | |
| dc.rights | Acesso Restrito | |
| dc.title | Back-Biased Undoped Nanowire-Based FETs in Silicon-On-Insulator Substrates with Nanometric Thicknesses | pt_BR |
| dc.type | Artigo | pt_BR |
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