| dc.contributor.author | Rayas-Sánchez, José E. | |
| dc.contributor.author | Bandler, John W. | |
| dc.contributor.author | Ismail, Mostafa A. | |
| dc.date.accessioned | 2013-05-20T19:37:45Z | |
| dc.date.accessioned | 2023-03-10T16:00:51Z | |
| dc.date.available | 2013-05-20T19:37:45Z | |
| dc.date.available | 2023-03-10T16:00:51Z | |
| dc.date.issued | 2001-05 | |
| dc.identifier.citation | J. W. Bandler, M. A. Ismail and J. E. Rayas-Sánchez, “Space mapping technology with applications in EM-based device modeling and statistical design,” in IEEE MTT-S Int. Microwave Symp. Workshop Notes and Short Courses, Phoenix, AZ, May 2001. | es |
| dc.identifier.uri | https://hdl.handle.net/20.500.12032/68302 | |
| dc.description | The Space Mapping concept intelligently links companion “coarse” and “fine” engineering models of different complexities, e.g., fullwave
electromagnetic (EM) simulations and empirical circuit-theory based models.
A comprehensive framework to engineering device modeling which we call Generalized Space Mapping (GSM) has been developed. GSM
is a tableau-based approach. It permits many different practical implementations. As a result the accuracy of available empirical models of
microwave devices can be significantly enhanced in selected regions of interest in the parameter space. We present two fundamental
illustrations: a basic Space Mapping Super Model (SMSM) which maps designable device parameters and a Frequency-Space Mapping
Super Model (FSMSM) which also maps the frequency variable. The SMSM and FSMSM concepts have been verified on several
modeling problems, typically utilizing a few relevant full-wave EM simulations. We present several microstrip examples, yielding
remarkable modeling improvement.
We consider the GSM technique to be very easy to implement. It has been reported to be very useful in the RF industry for development
of new library models involving commercial software such as Agilent Momentum and ADS.
Accurate yield optimization and statistical analysis of microwave components are crucial for manufacturability-driven designs in a time-tomarket
development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outputs of a
given manufacturing process. An efficient procedure to realize EM-based yield optimization and statistical analysis of microwave
structures using space mapping based neuromodels will be presented. Several practical microwave components illustrate our technique using commercial EM simulators. | es |
| dc.description.sponsorship | ITESO, A.C. | es |
| dc.language.iso | eng | es |
| dc.publisher | IEEE MTT-S International Microwave Symposium | es |
| dc.relation.ispartofseries | IEEE MTT-S International Microwave Symposium;2001 | |
| dc.rights.uri | http://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf | es |
| dc.subject | Space Mapping Super Model (SMSM) | es |
| dc.subject | Frequency-Space Mapping Super Model (FSMSM) | es |
| dc.subject | Microwave Circuits | es |
| dc.subject | Electromagnetic Based Design | es |
| dc.subject | Space Mapping | es |
| dc.title | Space Mapping Technology with Applications in EM-based Device Modeling and Statistical Design | es |
| dc.type | info:eu-repo/semantics/conferencePaper | es |
