Proposta de uma plataforma reconfigurável para testes de módulos SDRAM DDR3
dc.contributor.advisor | Krug, Margrit Reni | |
dc.contributor.author | Lessinger, Samuel | |
dc.date.accessioned | 2017-10-25T13:48:52Z | |
dc.date.accessioned | 2022-09-22T19:27:26Z | |
dc.date.available | 2017-10-25T13:48:52Z | |
dc.date.available | 2022-09-22T19:27:26Z | |
dc.date.issued | 2017-09-21 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12032/61092 | |
dc.description.abstract | This work consists on a proposal of a DDR3 SDRAM memory module reconfigurable test platform. Memory module testers are usually closed architecture systems, in which the user has little flexibility in their use. In this scenario, a low-cost portable platform, which enables the user to describe his own test algorithm becomes interesting. This work explores the use of Field Programmable Gate Arrays (FPGAs) in order to construct a fully reconfigurable testing platform. In this work a Stuck-At-Zero fault injection strategy was proposed and validated. Results report the success in executing fault detection algorithms as well as the software framework developed for the fault injection campaign. | en |
dc.description.sponsorship | PADIS - Programa de apoio ao desenvolvimento tecnológico da indústria de semicondutores | pt_BR |
dc.language | pt_BR | pt_BR |
dc.publisher | Universidade do Vale do Rio dos Sinos | pt_BR |
dc.rights | openAccess | pt_BR |
dc.subject | Teste eletrônico | pt_BR |
dc.subject | Electronic testing | en |
dc.title | Proposta de uma plataforma reconfigurável para testes de módulos SDRAM DDR3 | pt_BR |
dc.type | Dissertação | pt_BR |
Arquivos deste item
Arquivos | Tamanho | Formato | Visualização |
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Samuel Lessinger_.pdf | 3.503Mb | application/pdf | Visualizar/ |