dc.rights.license | Licencia Creative Commons Atribución – No Comercial – Sin Derivadas (CC BY-NC-ND 4.0) | |
dc.contributor.author | Molina Robles, Roberto | |
dc.contributor.author | García Ramírez, Ronny | |
dc.contributor.author | Chacón Rodríguez, Alfonso | |
dc.contributor.author | Rimolo Donadio, Renato | |
dc.contributor.author | Arnaud Maceira, Alfredo | |
dc.date.accessioned | 2021-10-21T20:27:37Z | |
dc.date.accessioned | 2022-09-21T22:17:11Z | |
dc.date.available | 2021-10-21T20:27:37Z | |
dc.date.available | 2022-09-21T22:17:11Z | |
dc.date.issued | 2021-04 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12032/46483 | |
dc.description.abstract | The RISC-V architecture is a very attractive option for developing application specific systems needing an affordable yet efficient central processing unit. Post-silicon validation on RISC-V applications has been done in industry for a while, however documentation is scarce. This paper proposes a practical low-cost post-silicon testing framework applied to a RISC-V RV32I based microcontroller. The framework uses FPGA-based emulation as a cornerstone to test the microcontroller before and after its fabrication. The platform only requires a handful of elements like the FPGA, a PC, the fabricated chip and some discrete components, without losing the capacity to functionally validate the design under test and save development testing time by using a re-utilize philosophy. | es |
dc.description.sponsorship | Agencia Nacional de Investigación e Innovación | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | es |
dc.publisher | IEEE | es |
dc.relation.ispartof | IEEE Latin America Electron Devices Conference, (LAEDC), 2021. | |
dc.subject | Post-silicon validation | es |
dc.subject | Testing | es |
dc.subject | FPGA | es |
dc.subject | RISC-V | es |
dc.subject | Microcontroller | es |
dc.subject | EDA tools | es |
dc.subject | Architecture | es |
dc.subject | Test generation | es |
dc.subject | I/O protocols | es |
dc.subject | SPI | es |
dc.subject | Testing-plataforms | es |
dc.title | An affordable post-silicon testing framework applied to a RISC-V based microcontroller | es |
dc.type | Artículo | es |