| dc.contributor.author | Seixas L.E. | |
| dc.contributor.author | Finco S. | |
| dc.contributor.author | Gimenez S.P. | |
| dc.date.accessioned | 2019-08-19T23:45:29Z | |
| dc.date.available | 2019-08-19T23:45:29Z | |
| dc.date.issued | 2017 | |
| dc.identifier.citation | Luis Eduardo Seixas; FINCO, S.; GIMENEZ, S. P.. VI-Based Measurement System Focusing on Space Applications. Journal of Electronic Testing, v. 1, n. 1, p. 1-8, 2017. | |
| dc.identifier.issn | 1573-0727 | |
| dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/1311 | |
| dc.description.abstract | © 2017, Springer Science+Business Media New York.This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application. | |
| dc.relation.ispartof | Journal of Electronic Testing: Theory and Applications (JETTA) | |
| dc.rights | Acesso Restrito | |
| dc.title | VI-Based Measurement System Focusing on Space Applications | |
| dc.type | Artigo | |
