A New Test Environment Approach to SEE Detection in MOSFETs

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Date

2015

Author

Luis Eduardo Seixas

SILVEIRA, M. A. G.; Guazzelli, Marcilei A.

Nilberto Medina

AGUIAR, V.A.P.

Nemitala Added

GIMENEZ, S. P.

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URI

https://hdl.handle.net/20.500.12032/40389

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Documentos - CUFEI