Underestimantion of Measured Self-Heating in Nanowires By Using Gate Resistance Technique
dc.contributor.author | MARINIELLO, GENARO | |
dc.contributor.author | CASSÉ, MIKÄEL | |
dc.contributor.author | REIMBOLD, GILLES | |
dc.contributor.author | PAVANELLO, MARCELO | |
dc.date.accessioned | 2019-08-19T23:45:12Z | |
dc.date.accessioned | 2022-09-21T19:49:32Z | |
dc.date.available | 2019-08-19T23:45:12Z | |
dc.date.available | 2022-09-21T19:49:32Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | MARINIELLO, GENARO; CASSÉ, MIKÄEL; REIMBOLD, GILLES; PAVANELLO, MARCELO. Underestimantion of Measured Self-Heating in Nanowires By Using Gate Resistance Technique. Electronics Letters (Online), v. 52, n. 23, p. 1935, 2016. | |
dc.identifier.issn | 1350-911X | |
dc.identifier.uri | https://hdl.handle.net/20.500.12032/40388 | |
dc.relation.ispartof | Electronics Letters (Online) | |
dc.rights | Acesso Aberto | |
dc.title | Underestimantion of Measured Self-Heating in Nanowires By Using Gate Resistance Technique | pt_BR |
dc.type | Artigo | pt_BR |
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