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Reducing soft error rate of socs analog-to-digital interfaces with design diversity redundancy
(Institute of Electrical and Electronics Engineers [Society Publisher], 2019-11-11)
Neste artigo, um system-on-chip programável comercial (PSoC 5, da Cypress Semiconductor) é testado sob irradiação de íons pesados com foco nos blocos de interface analógico-digital do sistema. Para tanto, um sistema de ...
Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
(2019-07-26)
International standards have been proposed and used to test Integrated Circuits (ICs) for Total-Ionizing Dose (TID) and Single-Event Upset (SEU) as well as for Electromagnetic Interference (EMI). Nevertheless, these standards ...