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Experimental Assessment of Variability in Junctionless Nanowire nMOS Transistors
(2021-09-06)
In this work, experimental assessment of the variability of threshold voltage and drain current in junctionless nanowire n MOS transistors is presented. Die-to-die variability of threshold voltage and drain current is ...
Performance of SOI Ω-Gate Nanowires from Cryogenic to High Temperatures
(2022-09-17)
© 2022, Brazilian Microelectronics Society. All rights reserved.—This review paper presents the electrical characteristics of Silicon-On-Insulator Ω-Gate nanowires in a wide range of temperatures. The operation in cryogenic ...