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γ-Particle coincidence technique for the study of nuclear reactions

Zagatto V.A.B.; Oliveira J.R.B.; Allegro P.R.P.; Chamon L.C.; Cybulska E.W.; Medina N.H.; Ribas R.V.; Seale W.A.; Silva C.P.; Gasques L.R.; Zahn G.S.; Genezini F.A.; Shorto J.M.B.; Lubian J.; Linares R.; Toufen D.L.; Silveira M.A.G.; Rossi E.S.; Nobre G.P. (2014)

The Saci-Perere γ ray spectrometer (located at the Pelletron AcceleratorLaboratory - IFUSP) was employed to implement the γ-particle coincidence technique for the study of nuclear reaction mechanisms. For this, the 18O+110Pd ...

Ionizing radiation effects in a rectifier circuit

Boas A.C.V.; Guazzelli M.A.; Giacomini R.C.; Medina N.H. (2019)

© Published under licence by IOP Publishing Ltd.This work aims to study the effects of ionizing radiation on a half-wave rectifier circuit. The diodes of the circuit, rectifier and Zener, were exposed to X-rays of 10 keV ...

The NUMEN project: NUclear Matrix Elements for Neutrinoless double beta decay

Cappuzzello F.; Agodi C.; Cavallaro M.; Carbone D.; Tudisco S.; Lo Presti D.; Oliveira J.R.B.; Finocchiaro P.; Colonna M.; Rifuggiato D.; Calabretta L.; Calvo D.; Pandola L.; Acosta L.; Auerbach N.; Bellone J.; Bijker R.; Bonanno D.; Bongiovanni D.; Borello-Lewin T.; Boztosun I.; Brunasso O.; Burrello S.; Calabrese S.; Calanna A.; Chavez Lomeli E.R.; D'Agostino G.; De Faria P.N.; De Geronimo G.; Delaunay F.; Deshmukh N.; Ferreira J.L.; Fisichella M.; Foti A.; Gallo G.; Garcia-Tecocoatzi H.; Greco V.; Hacisalihoglu A.; Iazzi F.; Introzzi R.; Lanzalone G.; Lay J.A.; La Via F.; Lenske H.; Linares R.; Litrico G.; Longhitano F.; Lubian J.; Medina N.H.; Mendes D.R.; Moralles M.; Muoio A.; Pakou A.; Petrascu H.; Pinna F.; Reito S.; Russo A.D.; Russo G.; Santagati G.; Santopinto E.; Santos R.B.B.; Sgouros O.; da Silveira M.A.G.; Solakci S.O.; Souliotis G.; Soukeras V.; Spatafora A.; Torresi D.; Magana Vsevolodovna R.; Yildirim A.; Zagatto V.A.B. (2018)

© 2018, SIF, Springer-Verlag GmbH Germany, part of Springer Nature.The article describes the main achievements of the NUMEN project together with an updated and detailed overview of the related R&D activities and theoretical ...

Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA

Benites L.A.C.; Benevenuti F.; De Oliveira A.B.; Kastensmidt F.L.; Added N.; Aguiar V.A.P.; Medina N.H.; Guazzelli M.A. (2019)

© 2019 IEEE.This paper presents comparative results from fault injection (FI) and heavy ions accelerated irradiation on a Xilinx 7 series static RAM (SRAM)-based field-programmable gate array (FPGA) for a soft-core ...

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γ-Particle coincidence technique for the study of nuclear reactions

Ionizing radiation effects in a rectifier circuit

The NUMEN project: NUclear Matrix Elements for Neutrinoless double beta decay

Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA

Electronic stopping power of Ti, V and Cr ions in Ge and Au at 150–500 keV/u energies

Dynamic distribution of potassium in sugarcane

A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector

Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs under Soft Errors

A system to measure isomeric state half-lives in the 10 ns to 10 μs range

Performance of electronic devices submitted to X-rays and high energy proton beams

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γ-Particle coincidence technique for the study of nuclear reactions

Ionizing radiation effects in a rectifier circuit

The NUMEN project: NUclear Matrix Elements for Neutrinoless double beta decay

Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA

Electronic stopping power of Ti, V and Cr ions in Ge and Au at 150–500 keV/u energies

Dynamic distribution of potassium in sugarcane

A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector

Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs under Soft Errors

A system to measure isomeric state half-lives in the 10 ns to 10 μs range

Performance of electronic devices submitted to X-rays and high energy proton beams