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Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization
(2017)
© 2017 Elsevier B.V.This work presents, for the first time, an experimental analysis of the low-frequency noise and the effective trap density dependence of junctionless nanowire transistors (JNTs) on the substrate bias. ...
Physical insights on the dynamic response of SOI n-and p-type junctionless nanowire transistors
(2018)
© 2018, Brazilian Microelectronics Society. All rights reserved.— This work evaluates, for the first time, the roles of the intrinsic capacitances and the series resistance on the dynamic response of p-and n-type Junctionless ...