Mostrar registro simples

dc.contributor.authorMichelly De Souza
dc.contributor.authorFLANDRE, D.
dc.contributor.authorMarcelo Antonio Pavanello
dc.date.accessioned2022-01-12T22:04:47Z
dc.date.accessioned2026-04-28T15:50:08Z
dc.date.available2022-01-12T22:04:47Z
dc.date.available2026-04-28T15:50:08Z
dc.date.issued2008-09-04
dc.identifier.citationDE SOUZA, M.; FLANDRE, D.; PAVANELLO, M. A. Channel length influence on the performance of source-follower buffers implemented with graded-channel SOI nMOSFETs. ECS Transactions, v. 14, n.1, p. 263-272, Sept. 2008.
dc.identifier.issn1938-5862
dc.identifier.urihttps://hdl.handle.net/20.500.12032/186957
dc.description.abstractThis work presents an evaluation of the influence of channel length on the performance of graded-channel (GC) SOI nMOSFETs operating as source-follower buffers. Experimental data is used to compare the buffer gain and linearity of GC and standard SOI nMOS transistors for different mask channel lengths and similar effective channel length. Two-dimensional numerical simulations were also performed, showing that the gain of buffers implemented with GC devices remains close to the theoretical limit even when short-channel devices are used. The simulated results indicate that the length of a source-follower buffer using GC devices can be reduced by a factor of 5, in comparison with the standard counterpart, without gain degradation or linearity worsening. © The Electrochemical Society.
dc.relation.ispartofECS Transactions
dc.rightsAcesso Restrito
dc.titleChannel length influence on the performance of source-follower buffers implemented with graded-channel SOI nMOSFETs
dc.typeArtigo de evento
dc.identifier.doi10.1149/1.2956040
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.description.volume14
dc.description.issuenumber1
dc.description.firstpage263
dc.description.lastpage272
fei.scopus.citations0
fei.scopus.eid2-s2.0-57749185001
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=57749185001&origin=inward
fei.scopus.updated2026-01-27
fei.scopus.subjectChannel devices
fei.scopus.subjectChannel lengths
fei.scopus.subjectEffective channel lengths
fei.scopus.subjectExperimental datums
fei.scopus.subjectGain degradations
fei.scopus.subjectNumerical simulations
fei.scopus.subjectSimulated results
fei.scopus.subjectSoi nmosfets


Arquivos deste item

ArquivosTamanhoFormatoVisualização

Este item aparece na(s) seguinte(s) coleção(s)

Mostrar registro simples


© AUSJAL 2022

Asociación de Universidades Confiadas a la Compañía de Jesús en América Latina, AUSJAL
Av. Santa Teresa de Jesús Edif. Cerpe, Piso 2, Oficina AUSJAL Urb.
La Castellana, Chacao (1060) Caracas - Venezuela
Tel/Fax (+58-212)-266-13-41 /(+58-212)-266-85-62

Nuestras redes sociales

facebook Facebook

twitter Twitter

youtube Youtube

Asociaciones Jesuitas en el mundo
Ausjal en el mundo AJCU AUSJAL JESAM JCEP JCS JCAP