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dc.contributor.authorD'OLIVEIRA, L. M.
dc.contributor.authorRodrido Doria
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorMichelly De Souza
dc.contributor.authorKILCHYTSHA, V.
dc.contributor.authorFLANDRE, D.
dc.date.accessioned2022-01-12T22:01:03Z
dc.date.accessioned2026-04-28T15:50:03Z
dc.date.available2022-01-12T22:01:03Z
dc.date.available2026-04-28T15:50:03Z
dc.date.issued2014-07-09
dc.identifier.citationD'OLIVEIRA, L. M.; DORIA, R. ; PAVANELLO, M. A.; DE SOUZA, M.; KILCHYTSHA, V.; FLANDRE, D. Asymmetric self-cascode FD SOI nMOSFETS harmonic distortion at cryogenic temperatures. 2014 11th International Workshop on Low Temperature Electronics, WOLTE 2014, p. 57-60, 2014.
dc.identifier.urihttps://hdl.handle.net/20.500.12032/186950
dc.description.abstractThis paper presents an analysis on the linearity of Asymmetric Self-Cascode (A-SC) of FD SOI nMOSGET transistors at cryogenic temperatures. This is achieved by evaluating experimental results of associations of transistors with various combinations of channel doping, obtained at temperatures ranging between liquid helium temperature (LHT, 4K) and room temperature (300K). It has been observed that A-SC presents better analog characteristics than the Symmetric Self-Cascode (S-SC) even at temperatures below 100K. The results show improved harmonic distortion at cryogenic temperatures and for structures composed by transistors with lower channel doping. © 2014 IEEE.
dc.relation.ispartof2014 11th International Workshop on Low Temperature Electronics, WOLTE 2014
dc.rightsAcesso Restrito
dc.titleAsymmetric self-cascode FD SOI nMOSFETS harmonic distortion at cryogenic temperatures
dc.typeArtigo de evento
dc.identifier.doi10.1109/WOLTE.2014.6881025
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-4448-4337
dc.description.firstpage57
dc.description.lastpage60
dc.subject.otherlanguageanalog parameters
dc.subject.otherlanguageharmonic distortion
dc.subject.otherlanguageliquid helium temperature
dc.subject.otherlanguageSOI nMOSFETS
fei.scopus.citations1
fei.scopus.eid2-s2.0-84906728487
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84906728487&origin=inward
fei.scopus.updated2026-01-27
fei.scopus.subjectAnalog parameters
fei.scopus.subjectAssociations of transistors
fei.scopus.subjectChannel dopings
fei.scopus.subjectCryogenic temperatures
fei.scopus.subjectLiquid helium temperature
fei.scopus.subjectRoom temperature
fei.scopus.subjectSelf-cascode
fei.scopus.subjectSOI n-MOSFETs


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