Temperature and Silicon Film Thickness Influence on the Operation of Lateral SOI PIN Photodiodes for Detection of Short Wavelengths
| dc.contributor.author | DE SOUZA, Michelly | |
| dc.contributor.author | BULTEEL, Olivier | |
| dc.contributor.author | FLANDRE, Denis | |
| dc.contributor.author | PAVANELLO, Marcelo A. | |
| dc.contributor.author | Pavanello, Marcelo Antonio | |
| dc.date.accessioned | 2019-08-19T23:45:10Z | |
| dc.date.accessioned | 2022-09-21T19:52:37Z | |
| dc.date.available | 2019-08-19T23:45:10Z | |
| dc.date.available | 2022-09-21T19:52:37Z | |
| dc.date.issued | 2011 | |
| dc.identifier.citation | DE SOUZA, Michelly; BULTEEL, Olivier; FLANDRE, Denis; PAVANELLO, Marcelo A.; Pavanello, Marcelo Antonio. Temperature and Silicon Film Thickness Influence on the Operation of Lateral SOI PIN Photodiodes for Detection of Short Wavelengths. JICS. Journal of Integrated Circuits and Systems (Ed. Português), v. 6, n. 2, p. 107-113, 2011. | |
| dc.identifier.issn | 1807-1953 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12032/41002 | |
| dc.relation.ispartof | JICS. Journal of Integrated Circuits and Systems (Ed. Português) | |
| dc.rights | Acesso Restrito | |
| dc.title | Temperature and Silicon Film Thickness Influence on the Operation of Lateral SOI PIN Photodiodes for Detection of Short Wavelengths | pt_BR |
| dc.type | Artigo | pt_BR |
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