A New Test Environment Approach to SEE Detection in MOSFETs
| dc.contributor.author | Luis Eduardo Seixas | |
| dc.contributor.author | SILVEIRA, M. A. G.; Guazzelli, Marcilei A. | |
| dc.contributor.author | Nilberto Medina | |
| dc.contributor.author | AGUIAR, V.A.P. | |
| dc.contributor.author | Nemitala Added | |
| dc.contributor.author | GIMENEZ, S. P. | |
| dc.date.accessioned | 2019-08-19T23:47:20Z | |
| dc.date.accessioned | 2022-09-21T19:49:32Z | |
| dc.date.available | 2019-08-19T23:47:20Z | |
| dc.date.available | 2022-09-21T19:49:32Z | |
| dc.date.issued | 2015 | |
| dc.identifier.citation | Luis Eduardo Seixas; SILVEIRA, M. A. G.; Guazzelli, Marcilei A.; Nilberto Medina; AGUIAR, V.A.P.; Nemitala Added; GIMENEZ, S. P.. A New Test Environment Approach to SEE Detection in MOSFETs. Advanced Materials Research (Online), v. 1083, p. 197-201, 2015. | |
| dc.identifier.issn | 1662-8985 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12032/40389 | |
| dc.relation.ispartof | Advanced Materials Research (Online) | |
| dc.rights | Acesso Aberto | |
| dc.title | A New Test Environment Approach to SEE Detection in MOSFETs | pt_BR |
| dc.type | Artigo | pt_BR |
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